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November 7, 2005
Smart Imaging Technologies has presentment concept of using simulated images for calibration and accuracy control in image analysis during ASTM Committee week in Dallas, TX. Copy of the presentation is available for download here
November 4, 2005
Smart Imaging Technologies delivered presentation “Methods for Automated Image Analysis of Nanomaterials” at the International Congress of Nanotechnology, San Francisco, CA. Copy of the presentation is available for download here
June 27, 2005
Smart Imaging Technologies conducted Nanodispersion Analysis Workshop
March 15, 2005
Smart Imaging Technologies Expands its Dealer Network into Asia
February 21, 2005
Statistically accurate length measurements of single-walled carbon nanotubes. Download Abstract from Rice University
February 3, 2005
Smart Imaging Technologies Presented New Solutions at NIST Workshop
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