CD-SEM Contours

Summary:
With no need for design data, the CD-SEM contour application is the easiest tool to use to extract the edge contours, at any/the desired threshold, and outputs it in GDSII format. No associated design data/clip is needed for this new capability and it is extremely easy and fast to use. After importing an image, it is just 1 mouse click to output the contours in GDSII. Simple, fast, easy and flexible.

Image Types Supported:
Top-down CD SEM images.

Sample Preparation:
Sample preparation and imaging services are available through qualified Service Partners.

Analysis Metrics/Outputs:

GDSII file of wafer print contours