SEM Contact / Via Array Analyzer

Solution Summary:
These automated solutions provide automated analysis and characterization of uniformed structures and quantify various deviations from the uniform order, such as deviations in size, shape, alignment, spatial distribution and others. The solutions can provide standard and advanced statistical data analysis with graphs and charts as well as selection of features based on deviation thresholds.

Source Image:
Digital Images of contact arrays obtained with SEM, TEM, AFM or Optical Imaging

Sample Report:

Sample preparation:
Sample preparation and imaging services are available through our Service Partners.

Determined Parameters:

	Advanced statistical analysis of variations of target parameter from the uniform pattern.
	Specific parameters are selected based on customer requirements.

Application features, configuration settings, results and reports are customizable to satisfy specific client requirements.