Home Smart Imaging Technologies
Digg!
Products Solutions Downloads Services Support Company
Home > Image Analysis > SIMAGIS® > Solutions > Solution Overview
Site Map
Solutions
Download Documents
How to Buy
SIMAGIS
Overview
Features
Functions
Templates
Examples
SIMAGIS Solutions
Material Science
Semiconductor
Nanotechnology
Petrography
Pipeline Maintenance
Life Science
Live Support
User Zone
Schedule Demo
Give Us Feedback
Send Your Problem

 

Carbon Nanorope Thickness Analysis (SEM)

Analyzed image:
The solution processes images captured from electronic microscopes.

Problem solved:
This solution allows automated determination of nanotube rope thickness. The procedure includes automated drawing of skeletal lines, removal of artifacts, selecting elongated ropes and calculating length for each selected rope. The results include aggregated statistics for the entire sample image as well as individual measurements for each nanorope.

Determined parameters:

Minimum thickness
Maximum thickness
Average thickness
Thickness standard deviation
Geometrical average value
Geometrical standard deviation value

This solution is ordered separately. Installed SIMAGIS® platform is required for the solution to function.

Examples


Analyzed image


Thickness distribution

About
News and Events
Clients
Dealers
Service Partners
Affiliations
Careers
Contact Us
Schedule Demo
Send Your Problem
Provide Feedback
Software Customization
Solution Development
Hardware Integration
On-Demand Analysis
Product Documents
Material Science Solutions
Nanotechnology Solutions
Semiconductor Solutions
Life Science Solutions
More Solutions
Image Analysis
3D Image Analysis
3D Modeling