Nano-Particles Self-Assembly, Quasi-Regular Grid (TEM)

Analyzed image:
TEM image of 2D self-organized magnetic arrays in the material with high level of anisotropy.

Problem solved:
Quantitative analysis of the local self-organization (for the area provided by the image).

Solution
Delaunay triangulation and Fourier-Bartlett flat wave superimposing methods are used to characterize irregularity degree of the structure (i.e. the deviation from the ideal close-packed "lattice structure" made of nanoparticles).

Determined parameters:
Grid distortion parameters.

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