Analysis of Microstructure of the Nano-Granular Thin Film (TEM)

Analyzed image:
TEM image of thin film nanoscale structure.

Problem solved:
Quantitative analysis (overall and local statistics, calculated in automated and manual regime) of granular microstructure. Image analysis results are used to generate the representative granular microstructure model based on the triangulation algorithm.

Determined parameters:

	Particles' size distribution
	Grains' size distribution
	Simulated grains' size distribution
	Polyhedrons' coordination number distribution

This solution is ordered separately. Installed SIMAGIS® platform is required for the solution to function.