Smart Imaging Technologies Announces SIMAGIS Semiâ¢
Award Winning, Tool-Independent Suite of Automated Image Metrology Applications Significantly Enhances Engineering Productivity While Improving Quality Control ProcessesOctober 16, 2007- From the trade show floor, American Vacuum Society (AVS) 54th International Symposium and Exhibition, Seattle Washington
SIMAGIS Semiâ¢, a comprehensive suite of integrated metrology applications is being announced today. With the first module shipped in the second half of 2006, the additional modules have been introduced over the past several months. All three modules are installed in production environments at numerous customer locations around the world. The three modules are
These modules run on top of the SIMAGISÂ® Quantitative Workbench, the flagship software product that was selected last month as one of the "Top 100 Innovative Products of the Year" by R&D Magazine. Smart Imaging Technologies is widely recognized for its work in automating metrology of nanoscale structures, particularly nanotubes. Key features of the SIMAGIS Semiâ¢ software suite include its Natural Automationâ¢ interface, online tutorial and Single Click Report Generator. A key advantage of the product, tool independence, facilitates cross-fleet calibration and accurate cross-tool measurements. "While several companies offer point solutions for semiconductor metrology, Smart Imaging Technologies is the first to market with a comprehensive tool-independent suite of integrated metrology applications utilizing a common user interface and workbench environment. Our customers have been impressed with the advanced capabilities and integration of our software that helps research and quality assurance engineers accelerate their research, improve process yield and cut time to market ." said Vitali Khatkov, Chief Executive Officer.
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